ISO/TS 17915:2013
For ISO/TS 17915:2013, item title is Optics and photonics — Measurement method of semiconductor lasers for sensing; status code is 9599; successor is ISO 17915:2018; withdrawn / published date is 2013-06-25, recorded from its source on 2026-08-05.
- Identifier
- ISO/TS 17915:2013 verified
- Item title
- Optics and photonics — Measurement method of semiconductor lasers for sensing verified
- Status code
- 9599 verified
- Successor
- ISO 17915:2018
- Withdrawn / published date
- 2013-06-25 verified
Verified
Review by
What the source says
60988,TS,,ISO/TS 17915:2013,Optics and photonics — Measurement method of semiconductor lasers for sensing,Optique et photonique — Méthode de mesure des lasers semi-conducteurs pour la sensibilité,2013-06-25,1,['31.260'],ISO/TC 172/SC 9,9599,,[72946],['en'],27,"<p>ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g.
— isopublicstorageprod.blob.core.windows.net, retrieved 2026-08-05
Source
- isopublicstorageprod.blob.core.windows.nethttps://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv