# ISO/TS 17915:2013 — Withdrawn and superseded ISO standards

For ISO/TS 17915:2013, item title is Optics and photonics — Measurement method of semiconductor lasers for sensing; status code is 9599; successor is ISO 17915:2018; withdrawn / published date is 2013-06-25, recorded from its source on 2026-08-05.

- **Identifier:** ISO/TS 17915:2013 _(verified: appears in the quote below)_
- **Item title:** Optics and photonics — Measurement method of semiconductor lasers for sensing _(verified: appears in the quote below)_
- **Status code:** 9599 _(verified: appears in the quote below)_
- **Successor:** ISO 17915:2018
- **Withdrawn / published date:** 2013-06-25 _(verified: appears in the quote below)_

## What the source says

> 60988,TS,,ISO/TS 17915:2013,Optics and photonics — Measurement method of semiconductor lasers for sensing,Optique et photonique — Méthode de mesure des lasers semi-conducteurs pour la sensibilité,2013-06-25,1,['31.260'],ISO/TC 172/SC 9,9599,,[72946],['en'],27,"<p>ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g.

## Source

- https://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv

Last verified: 2026-08-05. Review by: 2027-02-01.
Part of [Withdrawn and superseded ISO standards](https://referencesource.org/iso-standard-supersessions/).