ISO/TR 15969:2001
For ISO/TR 15969:2001, item title is Surface chemical analysis — Depth profiling — Measurement of sputtered depth; status code is 9599; successor is ISO/TR 15969:2021; withdrawn / published date is 2001-05-31, recorded from its source on 2026-08-05.
- Identifier
- ISO/TR 15969:2001 verified
- Item title
- Surface chemical analysis — Depth profiling — Measurement of sputtered depth verified
- Status code
- 9599 verified
- Successor
- ISO/TR 15969:2021
- Withdrawn / published date
- 2001-05-31 verified
Verified
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What the source says
28872,TR,,ISO/TR 15969:2001,Surface chemical analysis — Depth profiling — Measurement of sputtered depth,Analyse chimique des surfaces — Profilage d'épaisseur — Mesurage de l'épaisseur bombardée,2001-05-31,1,['71.040.40'],ISO/TC 201/SC 4,9599,,[80118],['en'],12,<p>This Technical Report gives guidelines for measuring the sputtered depth in sputtered depth profiling. The methods</p><p>of sputtered depth measurement described in this Technical Report are applicable to techniques of surface</p><p>chemical analysis when used in combination with ion bombardment for the removal of a part of a solid sample to a</p><p>typical sputtered depth of up to severalmicrometres.</p>
— isopublicstorageprod.blob.core.windows.net, retrieved 2026-08-05
Source
- isopublicstorageprod.blob.core.windows.nethttps://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv