ISO 25498:2010
For ISO 25498:2010, item title is Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope; status code is 9599; successor is ISO 25498:2018; withdrawn / published date is 2010-05-17, recorded from its source on 2026-08-05.
- Identifier
- ISO 25498:2010 verified
- Item title
- Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope verified
- Status code
- 9599 verified
- Successor
- ISO 25498:2018
- Withdrawn / published date
- 2010-05-17 verified
Verified
Review by
What the source says
42951,IS,,ISO 25498:2010,Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope,Analyse par microfaisceaux — Microscopie électronique analytique — Analyse par diffraction par sélection d'aire au moyen d'un microscope électronique en transmission,2010-05-17,1,['71.040.50'],ISO/TC 202/SC 3,9599,,[70359],['en'],28,"<p>ISO 25498:2010 specifies the method of selected-area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse micrometer and sub-micrometer sized areas of thin crystalline specimens. Such specimens can be obtained in the form of thin sections from a variety of
— isopublicstorageprod.blob.core.windows.net, retrieved 2026-08-05
Source
- isopublicstorageprod.blob.core.windows.nethttps://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv