# ISO 25498:2010 — Withdrawn and superseded ISO standards

For ISO 25498:2010, item title is Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope; status code is 9599; successor is ISO 25498:2018; withdrawn / published date is 2010-05-17, recorded from its source on 2026-08-05.

- **Identifier:** ISO 25498:2010 _(verified: appears in the quote below)_
- **Item title:** Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope _(verified: appears in the quote below)_
- **Status code:** 9599 _(verified: appears in the quote below)_
- **Successor:** ISO 25498:2018
- **Withdrawn / published date:** 2010-05-17 _(verified: appears in the quote below)_

## What the source says

> 42951,IS,,ISO 25498:2010,Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope,Analyse par microfaisceaux — Microscopie électronique analytique — Analyse par diffraction par sélection d'aire au moyen d'un microscope électronique en transmission,2010-05-17,1,['71.040.50'],ISO/TC 202/SC 3,9599,,[70359],['en'],28,"<p>ISO 25498:2010 specifies the method of selected-area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse micrometer and sub-micrometer sized areas of thin crystalline specimens. Such specimens can be obtained in the form of thin sections from a variety of

## Source

- https://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv

Last verified: 2026-08-05. Review by: 2027-02-01.
Part of [Withdrawn and superseded ISO standards](https://referencesource.org/iso-standard-supersessions/).