ISO 22493:2008
For ISO 22493:2008, item title is Microbeam analysis — Scanning electron microscopy — Vocabulary; status code is 9599; successor is ISO 22493:2014; withdrawn / published date is 2008-09-19, recorded from its source on 2026-08-05.
- Identifier
- ISO 22493:2008 verified
- Item title
- Microbeam analysis — Scanning electron microscopy — Vocabulary verified
- Status code
- 9599 verified
- Successor
- ISO 22493:2014
- Withdrawn / published date
- 2008-09-19 verified
Verified
Review by
What the source says
40975,IS,,ISO 22493:2008,Microbeam analysis — Scanning electron microscopy — Vocabulary,Analyse par microfaisceaux — Microscopie électronique à balayage — Vocabulaire,2008-09-19,1,"['37.020','01.040.37']",ISO/TC 202/SC 1,9599,,[64932],"['en','fr']",22,"<p>ISO 22493:2008 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.</p><p>The vocabulary is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of the vocabulary are app
— isopublicstorageprod.blob.core.windows.net, retrieved 2026-08-05
Source
- isopublicstorageprod.blob.core.windows.nethttps://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv