# ISO 22493:2008 — Withdrawn and superseded ISO standards

For ISO 22493:2008, item title is Microbeam analysis — Scanning electron microscopy — Vocabulary; status code is 9599; successor is ISO 22493:2014; withdrawn / published date is 2008-09-19, recorded from its source on 2026-08-05.

- **Identifier:** ISO 22493:2008 _(verified: appears in the quote below)_
- **Item title:** Microbeam analysis — Scanning electron microscopy — Vocabulary _(verified: appears in the quote below)_
- **Status code:** 9599 _(verified: appears in the quote below)_
- **Successor:** ISO 22493:2014
- **Withdrawn / published date:** 2008-09-19 _(verified: appears in the quote below)_

## What the source says

> 40975,IS,,ISO 22493:2008,Microbeam analysis — Scanning electron microscopy — Vocabulary,Analyse par microfaisceaux — Microscopie électronique à balayage — Vocabulaire,2008-09-19,1,"['37.020','01.040.37']",ISO/TC 202/SC 1,9599,,[64932],"['en','fr']",22,"<p>ISO 22493:2008 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.</p><p>The vocabulary is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of the vocabulary are app

## Source

- https://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv

Last verified: 2026-08-05. Review by: 2027-02-01.
Part of [Withdrawn and superseded ISO standards](https://referencesource.org/iso-standard-supersessions/).