ISO 20263:2017
For ISO 20263:2017, item title is Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials; status code is 9599; successor is ISO 20263:2024; withdrawn / published date is 2017-12-01, recorded from its source on 2026-08-05.
- Identifier
- ISO 20263:2017 verified
- Item title
- Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials verified
- Status code
- 9599 verified
- Successor
- ISO 20263:2024
- Withdrawn / published date
- 2017-12-01 verified
Verified
Review by
What the source says
67438,IS,,ISO 20263:2017,Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials,Analyse par microfaisceaux — Microscopie électronique analytique — Méthode de détermination de la position d'interface dans l'image de coupe transversale des matériaux en couches,2017-12-01,1,"['71.040.50','37.020']",ISO/TC 202/SC 3,9599,,[87682],['en'],45,"<p>ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface
— isopublicstorageprod.blob.core.windows.net, retrieved 2026-08-05
Source
- isopublicstorageprod.blob.core.windows.nethttps://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv