# ISO 20263:2017 — Withdrawn and superseded ISO standards

For ISO 20263:2017, item title is Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials; status code is 9599; successor is ISO 20263:2024; withdrawn / published date is 2017-12-01, recorded from its source on 2026-08-05.

- **Identifier:** ISO 20263:2017 _(verified: appears in the quote below)_
- **Item title:** Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials _(verified: appears in the quote below)_
- **Status code:** 9599 _(verified: appears in the quote below)_
- **Successor:** ISO 20263:2024
- **Withdrawn / published date:** 2017-12-01 _(verified: appears in the quote below)_

## What the source says

> 67438,IS,,ISO 20263:2017,Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials,Analyse par microfaisceaux — Microscopie électronique analytique — Méthode de détermination de la position d'interface dans l'image de coupe transversale des matériaux en couches,2017-12-01,1,"['71.040.50','37.020']",ISO/TC 202/SC 3,9599,,[87682],['en'],45,"<p>ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface

## Source

- https://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv

Last verified: 2026-08-05. Review by: 2027-02-01.
Part of [Withdrawn and superseded ISO standards](https://referencesource.org/iso-standard-supersessions/).