ISO 16413:2013
For ISO 16413:2013, item title is Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting; status code is 9599; successor is ISO 16413:2020; withdrawn / published date is 2013-02-12, recorded from its source on 2026-08-05.
- Identifier
- ISO 16413:2013 verified
- Item title
- Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting verified
- Status code
- 9599 verified
- Successor
- ISO 16413:2020
- Withdrawn / published date
- 2013-02-12 verified
Verified
Review by
What the source says
56703,IS,,ISO 16413:2013,"Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting","Évaluation de l'épaisseur, de la densité et de la largeur de l'interface des films fins par réflectrométrie de rayons X — Exigences instrumentales, alignement et positionnement, rassemblement des données, analyse des données et rapport",2013-02-12,1,"['71.040.40','35.240.70']",ISO/TC 201,9599,,[76403],['en'],30,"<p>ISO 16413:2013 specifies a method for the evaluation of thickness, density and interface width of single layer and multilayered thin films which have thicknesses be
— isopublicstorageprod.blob.core.windows.net, retrieved 2026-08-05
Source
- isopublicstorageprod.blob.core.windows.nethttps://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv