Reference Source

ISO 14701:2011

What is the item title for ISO 14701:2011?

For ISO 14701:2011, item title is Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness; replacement named by the register is ISO 14701:2018; publication date is 2011-08-02, verified against its source on 2026-11-03.

54929,IS,,ISO 14701:2011,Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness,Analyse chimique des surfaces — Spectroscopie de photoélectrons par rayons X — Mesurage de l'épaisseur d'oxyde de silicium,2011-08-02,1,['71.040.40'],ISO/TC 201/SC 7,9599,,[74818],['en'],15

— isopublicstorageprod.blob.core.windows.net, retrieved 2026-08-05

Identifier
ISO 14701:2011 verified
Item title
Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness verified
Replacement named by the register
ISO 14701:2018 verified
Publication date
2011-08-02 verified
Sourceisopublicstorageprod.blob.core.windows.net
Verified
Review by
DatasetWithdrawn and superseded ISO standards

Where each value comes from

The value above is stated away from the sentence quoted with the answer, so the passage that states it is shown here too.

Replacement named by the register

74818,IS,,ISO 14701:2018,Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness,Analyse chimique des surfaces — Spectroscopie de photoélectrons par rayons X — Mesurage de l'épaisseur d'oxyde de silicium,2018-10-31,2,['71.040.40'],ISO/TC 201/SC 7

— all from isopublicstorageprod.blob.core.windows.net, retrieved 2026-08-05

Source

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