ISO 14237:2000
For ISO 14237:2000, item title is Surface chemical analysis — Secondary-ion mass spectrometry — Determination of boron atomic concentration in silicon using uniformly doped materials; status code is 9599; successor is ISO 14237:2010; withdrawn / published date is 2000-02-03, recorded from its source on 2026-08-05.
- Identifier
- ISO 14237:2000 verified
- Item title
- Surface chemical analysis — Secondary-ion mass spectrometry — Determination of boron atomic concentration in silicon using uniformly doped materials verified
- Status code
- 9599 verified
- Successor
- ISO 14237:2010
- Withdrawn / published date
- 2000-02-03 verified
Verified
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What the source says
23942,IS,,ISO 14237:2000,Surface chemical analysis — Secondary-ion mass spectrometry — Determination of boron atomic concentration in silicon using uniformly doped materials,Analyse chimique des surfaces — Méthode par spectrométrie de masse des ions secondaires — Dosage des atomes de bore dans le silicium à l'aide de matériaux dopés uniformément,2000-02-03,1,['71.040.40'],ISO/TC 201/SC 6,9599,,[44882],['en'],22,
— isopublicstorageprod.blob.core.windows.net, retrieved 2026-08-05
Source
- isopublicstorageprod.blob.core.windows.nethttps://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv