# ISO 14237:2000 — Withdrawn and superseded ISO standards

For ISO 14237:2000, item title is Surface chemical analysis — Secondary-ion mass spectrometry — Determination of boron atomic concentration in silicon using uniformly doped materials; status code is 9599; successor is ISO 14237:2010; withdrawn / published date is 2000-02-03, recorded from its source on 2026-08-05.

- **Identifier:** ISO 14237:2000 _(verified: appears in the quote below)_
- **Item title:** Surface chemical analysis — Secondary-ion mass spectrometry — Determination of boron atomic concentration in silicon using uniformly doped materials _(verified: appears in the quote below)_
- **Status code:** 9599 _(verified: appears in the quote below)_
- **Successor:** ISO 14237:2010
- **Withdrawn / published date:** 2000-02-03 _(verified: appears in the quote below)_

## What the source says

> 23942,IS,,ISO 14237:2000,Surface chemical analysis — Secondary-ion mass spectrometry — Determination of boron atomic concentration in silicon using uniformly doped materials,Analyse chimique des surfaces — Méthode par spectrométrie de masse des ions secondaires — Dosage des atomes de bore dans le silicium à l'aide de matériaux dopés uniformément,2000-02-03,1,['71.040.40'],ISO/TC 201/SC 6,9599,,[44882],['en'],22,

## Source

- https://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv

Last verified: 2026-08-05. Review by: 2027-02-01.
Part of [Withdrawn and superseded ISO standards](https://referencesource.org/iso-standard-supersessions/).