# ISO 17470:2004 — Withdrawn and superseded ISO standards

For ISO 17470:2004, item title is Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry; status code is 9599; successor is ISO 17470:2014; withdrawn / published date is 2004-09-13, recorded from its source on 2026-08-05.

- **Identifier:** ISO 17470:2004 _(verified: appears in the quote below)_
- **Item title:** Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry _(verified: appears in the quote below)_
- **Status code:** 9599 _(verified: appears in the quote below)_
- **Successor:** ISO 17470:2014
- **Withdrawn / published date:** 2004-09-13 _(verified: appears in the quote below)_

## What the source says

> 30680,IS,,ISO 17470:2004,Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry,Analyse par microfaisceaux — Analyse par microsonde électronique (Microsonde de Castaing) — Lignes directrices pour l'analyse qualitative ponctuelle par spectrométrie de rayons X à dispersion de longueur d'onde (WDX),2004-09-13,1,['71.040.99'],ISO/TC 202/SC 2,9599,,[64783],"['en','fr']",10,"<p>ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-

## Source

- https://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv

Last verified: 2026-08-05. Review by: 2027-02-01.
Part of [Withdrawn and superseded ISO standards](https://referencesource.org/iso-standard-supersessions/).