# ISO 14606:2000 — Withdrawn and superseded ISO standards

For ISO 14606:2000, item title is Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials; status code is 9599; successor is ISO 14606:2015; withdrawn / published date is 2000-10-05, recorded from its source on 2026-08-05.

- **Identifier:** ISO 14606:2000 _(verified: appears in the quote below)_
- **Item title:** Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials _(verified: appears in the quote below)_
- **Status code:** 9599 _(verified: appears in the quote below)_
- **Successor:** ISO 14606:2015
- **Withdrawn / published date:** 2000-10-05 _(verified: appears in the quote below)_

## What the source says

> 23967,IS,,ISO 14606:2000,Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials,Analyse chimique des surfaces — Profilage d'épaisseur par bombardement — Optimisation à l'aide de systèmes mono- ou multicouches comme matériaux de référence,2000-10-05,1,['71.040.40'],ISO/TC 201/SC 4,9599,,[63272],"['en','fr']",15,

## Source

- https://isopublicstorageprod.blob.core.windows.net/opendata/_latest/iso_deliverables_metadata/csv/iso_deliverables_metadata.csv

Last verified: 2026-08-05. Review by: 2027-02-01.
Part of [Withdrawn and superseded ISO standards](https://referencesource.org/iso-standard-supersessions/).